{"id":1713,"date":"2015-05-13T09:07:00","date_gmt":"2015-05-13T07:07:00","guid":{"rendered":"http:\/\/bibliotecas.unileon.es\/ingenierias-industrial-informatica\/?p=1713"},"modified":"2018-12-13T18:04:48","modified_gmt":"2018-12-13T17:04:48","slug":"nac-open-position-tem-microscopistresearcher","status":"publish","type":"post","link":"https:\/\/bibliotecas.unileon.es\/ingenierias-industrial-informatica\/2015\/05\/13\/nac-open-position-tem-microscopistresearcher\/","title":{"rendered":"NAC: Open Position: TEM microscopist\/researcher"},"content":{"rendered":"\n<!-- This is the start of the WP Twitter Button code -->\n<div id=\"rk_wp_twitter_button\" style=\"margin: 0px 0px 0px 0px; float: right\"><a href=\"http:\/\/twitter.com\/share\" class=\"twitter-share-button\" data-url=\"https:\/\/bibliotecas.unileon.es\/ingenierias-industrial-informatica\/2015\/05\/13\/nac-open-position-tem-microscopistresearcher\/\" data-count=\"horizontal\">Tweet<\/a><script type=\"text\/javascript\" src=\"http:\/\/platform.twitter.com\/widgets.js\"><\/script><\/div>\n<!-- This is the end of the WP Twitter Button code -->\n\n<p>&#8212;Procedencia:<br \/>\nInstituci\u00f3n:IMDEA Materiales Institute<br \/>\nContacto <a href=\"mailto:correo-e%3Ajobs.materiales@imdea.org\">correo-e:jobs.materiales@<wbr \/>imdea.org<\/a><br \/>\n&#8212;<br \/>\nThe electron microscopy unit of IMDEA Materials Institute seeks a<\/p>\n<p>TEM microscopist\/researcher<br \/>\n(PhD in physics or materials science)<br \/>\n(Ref: TEM01)<\/p>\n<p>to work as scientific technician in the electron microscopy unit. We are seeking an innovative and skilled microscopist able to contribute to the application of advanced microscopy techniques (FIB, SEM, EBSD, EDS, TEM) to the characterization of materials, including the use of these techniques to carry out in-situ mechanical tests at the micro and nanoscale. It is expected that the selected candidate will help\/assist other researchers (including external users) in the use of the microscopy facilities as well as develop his own research lines in the area of electron microscopy.<br \/>\nRequirements: Candidates should have a PhD in Materials Engineering or Physics The applicant must be an experienced transmission electron microscopist, with accredited experience in:<\/p>\n<p>&#8211; High-resolution electron microscopy (HREM)<br \/>\n&#8211; Electron diffraction and CBED analysis<br \/>\n&#8211; BF\/DF imaging, including weak-beam conditions for dislocation\/interface analysis<br \/>\n&#8211; STEM HAADF and chemical mapping<br \/>\n&#8211; TEM tomography<\/p>\n<p>A good background in the use of SEM, EBSD and FIB, as well as in nanomechanical testing, will be strongly valued. Fluent English is required.<\/p>\n<p>Conditions: Contract with full social security coverage. Salary depending on qualifications.<br \/>\nDuration: One year with extension possibility Starting date: As soon as the position is filled<br \/>\n&#8212;&#8212;&#8212;&#8212;&#8212;-<br \/>\nInformaci\u00f3n complementaria de la oferta:<br \/>\nInterested candidates should submit their aplication through the institute\u2019s website: <a href=\"http:\/\/www.materials.imdea.org\/open-positions\/applicationform?ref=tem01\" target=\"_blank\">http:\/\/www.materials.imdea.<wbr \/>org\/open-positions\/<wbr \/>applicationform?ref=tem01<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"<p>Tweet &#8212;Procedencia: Instituci\u00f3n:IMDEA Materiales Institute Contacto correo-e:jobs.materiales@imdea.org &#8212; The electron microscopy unit of IMDEA Materials Institute seeks a TEM microscopist\/researcher (PhD in physics or materials science) (Ref: TEM01) to work as scientific technician in the electron microscopy unit. We are &hellip; <a href=\"https:\/\/bibliotecas.unileon.es\/ingenierias-industrial-informatica\/2015\/05\/13\/nac-open-position-tem-microscopistresearcher\/\">Sigue leyendo <span class=\"meta-nav\">&rarr;<\/span><\/a><\/p>\n","protected":false},"author":18,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_bbp_topic_count":0,"_bbp_reply_count":0,"_bbp_total_topic_count":0,"_bbp_total_reply_count":0,"_bbp_voice_count":0,"_bbp_anonymous_reply_count":0,"_bbp_topic_count_hidden":0,"_bbp_reply_count_hidden":0,"_bbp_forum_subforum_count":0,"footnotes":""},"categories":[1],"tags":[],"class_list":["post-1713","post","type-post","status-publish","format-standard","hentry","category-sin-categoria"],"_links":{"self":[{"href":"https:\/\/bibliotecas.unileon.es\/ingenierias-industrial-informatica\/wp-json\/wp\/v2\/posts\/1713","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/bibliotecas.unileon.es\/ingenierias-industrial-informatica\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/bibliotecas.unileon.es\/ingenierias-industrial-informatica\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/bibliotecas.unileon.es\/ingenierias-industrial-informatica\/wp-json\/wp\/v2\/users\/18"}],"replies":[{"embeddable":true,"href":"https:\/\/bibliotecas.unileon.es\/ingenierias-industrial-informatica\/wp-json\/wp\/v2\/comments?post=1713"}],"version-history":[{"count":0,"href":"https:\/\/bibliotecas.unileon.es\/ingenierias-industrial-informatica\/wp-json\/wp\/v2\/posts\/1713\/revisions"}],"wp:attachment":[{"href":"https:\/\/bibliotecas.unileon.es\/ingenierias-industrial-informatica\/wp-json\/wp\/v2\/media?parent=1713"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/bibliotecas.unileon.es\/ingenierias-industrial-informatica\/wp-json\/wp\/v2\/categories?post=1713"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/bibliotecas.unileon.es\/ingenierias-industrial-informatica\/wp-json\/wp\/v2\/tags?post=1713"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}